ENBIS-17 in Naples

9 – 14 September 2017; Naples (Italy) Abstract submission: 21 November 2016 – 10 May 2017

Post-Conference Course: Large-Scale Statistical Process Monitoring

14 September 2017, 09:00 – 13:00

Statistical process monitoring (SPM) concerns the retrospective review of process performance to guide subsequent action, and is one of the cornerstones of quality control in manufacturing and beyond. Typically, though, SPM relates to a small number of processes, both in its supporting literature and in actual practice. However, in a modern manufacturing plant, there may be thousands of process measurements worth monitoring. Furthermore, with initiatives like Industry 4.0 and a prevailing climate of 'big data' promising dramatic increases in the availability of time-based data, this number will escalate rapidly.

In this workshop, attendees will see how to 'scale up' SPM to this new reality. Through a combination of presentation and demonstration, they will see examples of how to:

  • Choose measures and graphs that will be most useful when presented with thousands of process measures that are to be analysed retrospectively.
  • Use summary measures and ordering to find the processes of most concern.
  • Use graphs that show many processes in one graph.
  • Adapt for test multiplicity, robustness, and other difficulties.
  • Efficiently compute and present all the measures.

All demonstrations will use JMP or JMP Pro. All workshop content will be made available to participants. Participantsmay come with JMP 13 pre-installed on their computers so they can follow along themselves, but this is not mandatory. A fully functional thirty-day trial version of JMP can be downloaded from www.jmp.com/trial if required.

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