ENBIS: European Network for Business and Industrial Statistics

Session organised by the Measurement Uncertainty SIG

Abstract

Submitted by

Alistair Forbes

Authors

Alistair Forbes

Affiliation

National Physical Laboratory

Abstract

The measurement uncertainty SIG has two complementary themes, 1) the application of statistical methods in measurement science (metrology), and 2) measurement systems in process control, conformance assessment and quality improvement. The central aim of metrology is to establish the traceability of measurement results to standard units, providing a foundation for commerce, science and technology alike. National Metrology Institutes (NMIs) are responsible for defining and maintaining measurement standards at a national level, overseen by the Bureau International des Poids et Mesures (BIPM) at the international level. The session will include four talks from speakers from NMIs:

Approaches to comparing different designs of key comparison, Maurice Cox, Peter Harris and Clare Matthews, National Physical Laboratory, UK

Optimised uncertainty and cost operating characterisitcs: new approaches to statistical significance testing in global conformance assessment, Leslie R Pendrill, SP Technical Research Institute of Sweden,

CMM measurement uncertainty and form error assessment, Alistair Forbes, Nationial Physical Laboratory, UK

On hierachical vs non-hierarchical comparisons in metrology and testing, Franco Pavese, INRIM, Italy

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