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ENBIS8 Athens
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Programme Item
ENBIS8 Athens
21 – 25 September 2008
Abstract submission: 14 March – 11 August 2008
Overview
Programme
Abstracts
Metrology
23 September 2008, 12:00 – 13:00
Common terminology as a pre-requisite for a common use in international standardisation of basic concepts for expressing measurement uncertainty in metrology and testing
12:00 – 12:20
Franco Pavese
Bayesian Hierarchical Model for Integrating Multi-resolution Metrology Data
12:20 – 12:40
Heidi Xia, Yu Ding, and Bani Mallick
Revision of the Guide to the Expression of Uncertainty in Measurement
12:40 – 13:00
Alistair Forbes
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