ENBIS-16 in Sheffield

11 – 15 September 2016; Sheffield Abstract submission: 20 March – 4 July 2016

Special Session: Metrology

12 September 2016, 11:30 – 12:30

Reassessment of Calibration and Measurement Capabilities based on Key Comparison Results
11:30 – 11:50 Katsuhiro Shirono (National Institute of Advanced Industrial Science and Technology), Maurice Cox (National Physical Laboratory)

Prior Information, but no MCMC: A Bayesian Normal Linear Regression Case Study
11:50 – 12:10 Katy Klauenberg (Physikalisch-Technische Bundesanstalt), Gerd Wübbeler (Physikalisch-Technische Bundesanstalt), Bodo Mickan (Physikalisch-Technische Bundesanstalt), Peter Harris (National Physical Laboratory), Clemens Elster (Physikalisch-Technische Bundesanstalt)

A Two-Stage Bayesian Approach for the Analysis of Multispectral Camera Measurements
12:10 – 12:30 Marcel Dierl (Physikalisch-Technische Bundesanstalt), Timo Eckhard (Chromasens GmbH), Bernhard Frei (Chromasens GmbH), Maximilian Klammer (Chromasens GmbH), Sascha Eichstädt (Physikalisch-Technische Bundesanstalt), Clemens Elster (Physikalisch-Technische Bundesanstalt)

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