ENBIS-15 in Prague

6 – 10 September 2015; Prague, Czech Republic Abstract submission: 1 February – 3 July 2015

Contributed Session: Reliability 2

7 September 2015, 15:35 – 16:35

Advanced Bayesian Estimation of Weibull Decreasing Failure Rate Distributions for Semiconductor Burn-In
15:35 – 15:55 Daniel Kurz (Department of Statistics, Alpen-Adria University of Klagenfurt), Horst Lewitschnig (Infineon Technologies Austria AG), Jürgen Pilz (Department of Statistics, Alpen-Adria University of Klagenfurt)

Comparison Between Constant-Stress and Step-Stress Accelerated Life Tests for Series Systems under Exponential Lifetime Distributions
15:55 – 16:15 Tsai-Hung Fan (National Central University), Yi-Fu Wang (National Tsing-Hua University)

A Poisson Process with Non-Monotonic Intensity for the Reliability of Mechanical Valves
16:15 – 16:35 Pasquale Erto (University of Naples Federico II), Massimiliano Giorgio (Second University of Naples), Antonio Lepore (University of Naples Federico II)

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