ENBIS-14 in Linz

21 – 25 September 2014; Johannes Kepler University, Linz, Austria Abstract submission: 23 January – 22 June 2014

Contributed Session: Reliability 2

24 September 2014, 09:00 – 10:00

Smart Power Semiconductor Reliability Evaluation Using a Gaussian Process based Norris-Landzberg Model
09:00 – 09:20 Kathrin Plankensteiner (KAI Kompetenzzentrum Automobil- und Industrieelektronik GmbH), Olivia Bluder (KAI Kompetenzzentrum Automobil- und Industrieelektronik GmbH), Jürgen Pilz (Alpen-Adria Universität Klagenfurt)

Area Scaling of Early Life Failure Probabilities with Multiple Reference Products in Semiconductor Manufacturing
09:20 – 09:40 Daniel Kurz (Department of Statistics, Alpen-Adria University of Klagenfurt), Horst Lewitschnig (Infineon Technologies Austria AG, Villach), Jürgen Pilz (Department of Statistics, Alpen-Adria University of Klagenfurt)

Some Examples of the Parsum Equation and What it Means
09:40 – 10:00 Chris McCollin (Nottingham Trent University)

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